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System Test

Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .

See Also: Systems, Equipment, Test Systems, System Integrators


Showing results: 406 - 420 of 4352 items found.

  • Controlled impedance test system

    CITS900s4 - Polar Instruments Inc

    CITS900s4 is the seventh generation of Impedance test system from polar, and typically the most popular model for customers who are new to impedance control. CITS900s4 provides both differential and single ended measurement capability along with 4 channels to provide flexible probe connection.

  • D-Mic Auto Test System

    BK9013 - BaKo Co., Ltd

    If your company produces millions of D-mics per month, take a look at the BK9013. Based on our BK3012V2 D-Mic Tester, the fully automatic BK9013 is our fastest D-Mic test system. With 4 or 8 couplers, the BK9013 can simultaneously test and sort up to 8 D-Mics into 8 passing grades and 7 different causes of failure in just a few seconds! You can view the results in real time or store them to analyze later.

  • Wireless System For Test And Measurement

    TM400 Compact - Lectrosonics, Inc.

    The TM400 system was designed to provide the ideal link between calibrated test microphones and measurement equipment such as SIM®, SIA SMAART Live®, TEF® or other systems. By using a radio link, long cables can be eliminated thus saving time and providing opportunities for additional measurements to increase accuracy. The microphone can even be moved around in the venue while the audience is present – something that is impossible with a cabled measurement microphone.

  • Accelerated Life Test Systems

    Intepro Systems

    Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions

  • Multi-Wafer Test & Burn-in System

    FOX-XP - Aehr Test Systems

    The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.

  • Benchtop Communication Test System

    ATS3000A - Astronics Corporation

    The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.

  • Transportation Simulation Test System

    KRD50 series - CME Technology Co. Ltd.

    KRD50 series transportation simulation test system is to simulate the actual road conditions such as shocks and vibrations during the transportation of various items of a specific load, and to evaluate the effect of the actual working conditions on the loading, unloading, transportation, packaging, sealing or internal structure of the goods. In order to assess or confirm the products and packaging.

  • Zero-distance Drop Test System

    KRD40 series - CME Technology Co. Ltd.

    KRD40 series drop tester, mainly simulates the resistance to drop and impact of large and heavy packaging products. Its strong power system and unique sample holder facilitate easy loading and unloading of oversized and overweight items and automatically rise to the setting. After the height, the drop test is completed. It can realize the drop test of the edge, surface and angle of the sample. This equipment is mainly used to evaluate the ability of product or packaging to withstand drops during transportation and loading and unloading, so as to improve product and packaging design.

  • Power device test system

    ShibaSoku Co., Ltd.

    This system is suitable for DC testing of IGBT, IGBT module (1in1~7in1). Built-in hi-current switching relay circuit inside test head, it is capable ofDC testing from device itself to module. Highly accurate repeatability testing is available by high speed rise time which is suppressed its heat in hi-current

  • Diode & Rectifier Test Systems

    D&V Electronics LTD

    D&V’s diode and rectifier test systems provide a quick, accurate and easy to use interface to check and measure all main parameters of regular and avalanche rectifiers. Real life conditions are simulated to maximize diagnostic capabilities. Additionally, analysis of the rectifier’s thermal resistance can be performed to detect poor internal diode connections and related defects.

  • Transmission Line Test System

    GDLP - HV Hipot Electric Co.,Ltd.

    GDLP series Transmission Line Test System is a new generation power transmission line frequency parameter testing system.It integrated with frequency conversion testing power,precise measuring module and DSP high speed digital processing chip,which eliminate strong interference and ensure the safety of equipment, with convenient, fast and accurate measure .

  • Full Wafer Test System

    FOX-1P - Aehr Test Systems

    Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.

  • Residential Meter Test System

    RADIAN RM-17 - Radian Research, Inc.

    The Radian Research RM-17 Residential Meter Test System offers simplicity for testing residential watthour meters. In a compact, lightweight package of 7 pounds, the RM-17 delivers accuracy and flexibility in a practical solution to watthour meter testing. The RM-17 combines simple operation, advanced data management, and exceptional accuracy to provide a cost effective approach to field testing.

  • Hardware-in-the-Loop Test Systems

    HIL - Genuen

    Our early development efforts and NI VeriStand expertise uniquely qualify us to maximize the benefits of and provide top-notch integration services for this software platform. Wineman Technology offers powerful and flexible MIL and HIL testing solutions, such as: Full range of MIL and HIL test systems. Software for testing. Software for simulating electronic control modules. Fault insertion unit (FIU)..

  • C-Mic Auto Test System

    BK9010B - BaKo Co., Ltd

    Based on the BK3010V2 C-Mic Tester, the BK9010B is our fastest C-mic test system. Fully automatic, the BK9010B loads the mics in place and after testing, it sorts passing microphones into 8 quality classes, and failing microphones according to the reason they failed. Each mic is put into its appropriate bin. As testing progresses, you can view the data graphically in real time or save it to be viewed or analyzed later.

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